LEO (Zeiss) 1550
Description
The LEO (Zeiss) 1550 is a high-performance Schottky field-emission SEM capable of resolution in 2-5 nm size range. It is used for high-resolution imaging of surfaces, qualitative assessment of the distribution of elements (with atomic numbers between boron and uranium), submicron structure analysis, and determination of crystal orientation and crystalline texture.
Sample Images (click image for details)
Image on the Cover of "Geology," Volume 35, Number 2, February 2007. Preserved animal embryo fossils from the Ediacaran Doushantuo Formation in South China offer a rare opportunity to study the evolution and embryology of early animals. For more details, see "Rare helical spheroidal fossils from the Doushantuo Lagerstatte: Ediacaran animal embryos come of age?" by Shuhai Xiao, James W. Hagadorn, Chuanming Zhou and Xunlai Yuan, pages 115-118 of the journal. Image courtesy of James W. Hagadorn and Steve McCartney.
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Image on the Cover of "Molecular Microbiology," Volume 62, Number 3, February 2006. Migrating bacteria. For more details, see "Type IV pili-dependent gliding motility in the Gram-positive pathogen Clostridium perfringens and other Clostridia" by John J. Varga, Van Nguyen, David K. O'Brien, Katherine Rodgers, Richard A. Walker and Stephen B. Melville, pages 680-694 of the journal. Image courtesy John J. Varga, Stephen B. Melville, and Steve McCartney.
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Spherulite crystallization in an amorphous polymer melt. Image courtesy of Steve McCartney.
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Porous gold formed by dealloying a silver gold mixture electrochemically and then annealing at 1073K for 15 minutes to increase the pore size. Image courtesy of Aziz Dursan and Steve McCartney.
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Long-stemmed rose patterned in silicon with electron beam lithography. Rose is about 25 microns long. Image courtesy of Steve McCartney.
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Cool little fractal crystals of something or other. Image courtesy of Steve McCartney.
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General Specifications
The NCFL's Hysitron TriboIndenter is equipped with:
- # In-lens secondary electron, and Robinson-type back-scattered electron detectors
- Oxford INCA Energy E2H X-ray Energy Dispersive Spectrometer (EDS) system with Silicon Drifted detector
- HKL Nordlys II Electron Back Scatter Diffraction (EBSD) system, including a Forward Scatter Electron (FSE) detector
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