Veeco Dimension 3100 Nanoman AFM
Description
The Veeco Dimension 3100 Nanoman AFM provides a variety of high resolution surface imaging techniques and the ability to manipulate or create nanoscale structures. Imaging techniques include contact mode AFM, tapping mode AFM, Scanning Tunnelling AFM, Conductive AFM, and Scanning Capacitance Microscopy. The X and Y position of the tip can be independently controlled to allow precise placement of the tip. Direct manipulation of particles and localized charge placement or oxidation of a substrate is possible.
Sample Images (click image for details)
General Specifications
The NCFL's Veeco Dimension 3100 Nanoman AFM is equipped with:
- Contact and tapping AFM modes
- Conductive AFM modules for nA-microAmp current measurements
- Scanning Capacitance Microscopy
- Resolution: Sub-nanometer height measurement capability (X-Y resolution tip is dependent)
- X and Y piezo control for precise manipulation of particles on sample surface
Detailed Specifications
Downloadable Pdf File
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