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FEI Titan 300




Description

The FEI Titan 300 is a Scanning Transmission Electron Microscope that uses interactions between an electron beam a thin sample to extract information about the structure and chemistry of materials. The instrument can image the arrangement of atoms within solids with sub-angstrom resolution - the highest resolution available with any microscopy technique. It is used to study the nature of internal defects and interfaces that influence the mechanical, chemical, electrical, magnetic, and optical properties of solids.

Sample Images (click image for details)







General Specifications

The NCFL's FEI Titan 300 is equipped with:

  • Field-emission electron gun, variable accelerating voltages from 80 kV to 300 kV (currently software limited to 200 kV)
  • Scanning Transmission Electron Microscopy mode (STEM)
  • High-Angle Annular Dark Field Detector (HAADF or Z-contrast mode)
  • Energy Dispersive Spectroscopy (EDS)
  • Energy Filtered TEM imaging and Electron Energy Loss Spectroscopy (EELS) via a Gatan Image Filter (GIF)
  • Low-dose imaging mode
  • Lorentz lens for magnetic domain imaging
  • Electron tomography package for 3D imaging

Detailed Specifications

Downloadable Pdf File


Philips EM 420

Description

The Philips EM 420 is a Scanning Transmission Electron Microscope that uses interactions between an electron beam and a thin sample to extract information about the structure of materials. The instrument is used primarily for imaging the internal structure of materials using differential electron absorption and diffraction contrast. This instrument is fairly easy to learn how to use. It can also be considered a survey instrument in support of the more complex Titan TEM.

We train users to operate this microscope. After approval the user can operate the instrument independently. Typically 3 two hours sessions are sufficient for minimum competency in instrument use. Approval depends on individual competency.

The first 2 sessions utilize a standard Au-C sample and the student learns how to work with an ideal sample.The third of the two hour sessions is where we address the specific application of the student. Further application training would follow as needed.

E-mail or visit and talk with John McIntosh about your training interest and then schedule 3 two hour sessions on the instrument. Try to keep all 3 training sessions within a week or two to not forget what you have learned. (9-11AM, 1-3PM are the default time blocks, others are possible, Noon - 1PM is lunch time)

Cross reference the "John schedule" for open time blocks before putting in the training request on the EM420 scheduler. It does no good to request an instrument time slot for training during a time when John the trainer is not available.

General Specifications

The NCFL's Philips EM 420 is equipped with:

  • Tungsten filament electron gun
  • 120 kV maximum accelerating voltage
  • Single and double axis sample tilt
  • CCD camera for recording images