FEI Titan 300
Description
The FEI Titan 300 is a Scanning Transmission Electron Microscope that uses interactions between an electron beam a thin sample to extract information about the structure and chemistry of materials. The instrument can image the arrangement of atoms within solids with sub-angstrom resolution - the highest resolution available with any microscopy technique. It is used to study the nature of internal defects and interfaces that influence the mechanical, chemical, electrical, magnetic, and optical properties of solids.
Sample Images (click image for details)
General Specifications
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The NCFL's FEI Titan 300 is equipped with:
- Field-emission electron gun, variable accelerating voltages from 80 kV to 300 kV (currently software limited to 200 kV)
- Scanning Transmission Electron Microscopy mode (STEM)
- High-Angle Annular Dark Field Detector (HAADF or Z-contrast mode)
- Energy Dispersive Spectroscopy (EDS)
- Energy Filtered TEM imaging and Electron Energy Loss Spectroscopy (EELS) via a Gatan Image Filter (GIF)
- Low-dose imaging mode
- Lorentz lens for magnetic domain imaging
- Electron tomography package for 3D imaging
Philips EM 420
Description
The Philips EM 420 is a Scanning Transmission Electron Microscope that uses interactions between an electron beam and a thin sample to extract information about the structure of materials. The instrument is used primarily for imaging the internal structure of materials using differential electron absorption and diffraction contrast. It is the used to survey samples before putting them in the Titan.
General Specifications
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The NCFL's Philips EM 420 is equipped with:
- Tungsten filament electron gun
- 120 kV maximum accelerating voltage
- Scanning Transmission Electron Microscopy mode (STEM)
- CCD camera for recording images